아이에스 테크놀로지 Probe Card 제조 전문기업

    현재메뉴

    Probe card Specification

    Probe card Specification 목록
    ITEM Specification
    Planarity ± 20㎛
    Alignment ± 10㎛
    Leakage I/O : < 10nA
    Contact Resistance < 50hm
    test Temperature Hot : 120℃ / Cold : -40℃
    Min pitch (Full Array) 2.5mil (63.5㎛) : > 130㎛ Pitch / 3mil (76.2㎛) : > 150㎛ Pitch
    Tip Style Flat, Point, Round

    Vertical Probe Card 구조도

    Application 별 Probe Card 규격 목록
    ITEM SPEC
    MAX PIN COUNT 30,000
    DUT (Flip Chip BGA) 1, 2, 4, 6
    MIN PITCH 130㎛
    DIGITAL SPEED < 200 Mhz
    ANALOG Freq 1.5Ghz@-3dB

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